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Mapping quantitative trait loci associated with soybean resistance to common cutworm and soybean compensatory growth after defoliation using SNP marke

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发布时间:2015-10-08
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Wang, Hui; Yan, Honglang; Du, Haiping; Chao, Maoni; Gao, Zhongjie; Yu, Deyue

Mapping quantitative trait loci associated with soybean resistance to common cutworm and soybean compensatory growth after defoliation using SNP marker-based genome-wide association analysis

MOLECULAR BREEDING doi:10.​1007/​s11032-015-0360-z August 2015 IF(2.57)