Bhat, Javaid Akhter; Adeboye, Kehinde Adewole; Ganie, Showkat Ahmad; Barmukh, Rutwik; Hu, Dezhou; Varshney, Rajeev K. K.; Yu, Deyue

Genome-wide association study, haplotype analysis, and genomic prediction reveal the genetic basis of yield-related traits in soybean (Glycine max L.)

FRONTIERS IN GENETICS IF5=4.933