Mapping quantitative trait loci associated with soybean resistance to common cutworm and soybean compensatory growth after defoliation using SNP marke
发布时间:2015-10-08 浏览次数:
 

Wang, Hui; Yan, Honglang; Du, Haiping; Chao, Maoni; Gao, Zhongjie; Yu, Deyue

Mapping quantitative trait loci associated with soybean resistance to common cutworm and soybean compensatory growth after defoliation using SNP marker-based genome-wide association analysis

MOLECULAR BREEDING doi:10.​1007/​s11032-015-0360-z August 2015 IF(2.57)